Sigray is hosting a webinar on on “Blazing New Frontiers in Lab-based X-ray Microscopy”
There are two timeframes for this webinar:
- Wednesday, February 23 2022 at 8am PST (designed for USA/European participants: 11am EST, 4pm UK)
- Wednesday, February 23 2022 at 9pm PST (designed for Asian participants: 2pm in Korea/Japan, 1pm China, 10:30 am India – note that this would be Thursday Feb 24 for Asian participants)
Registration Form (note: it may be slow to load. If it does not show up, you may access the form directly through this link)
Synchrotron radiation based X-ray microtomography provides several advantages in terms of submicron spatial resolution 3D imaging with high throughput. Using tunable monochromatic x-ray beam, high contrast imaging of soft materials and biological tissues can be obtained which are generally not feasible with lab based microCTs. However, in the past decade many of these advantages have been narrowed with the introduction of Lab based X-ray microscopy (XRM) such as the Zeiss Xradia XRMs. The latter uses high flux sub-micron spot sized lab X-ray source, optical lens -scintillator coupled CCD to achieve submicron pixel imaging resolution. By varying the thickness of the scintillators, relatively high contrast images of certain soft materials are also obtained.
Notwithstanding there are several issues the existing XRM could not address.
- The need for high speed tomography at micron to submicron imaging resolution on relatively large specimens typically encountered in the electronics and flat panel industries. Here it is desirable to inspect large packages, pcbs, wafers, flat panels, flat battery pouches, CFRP (carbon fibers reinforced polymers) for defects and without the need to destructively or physically sectioning these samples to smaller sizes.
- The need for a versatile XRM tool in a central research lab that has the best of the conventional lab XRM for high resolution tomography for hard materials and yet has the power of monochromatic beams similar to synchrotron beam lines to tune x-ray energy to enhance contrast of soft materials and biological tissue.
In this webinar we will announce exciting solutions to the aforementioned limitations. A novel, patent pending 3D imaging technique to detect defects down to 0.5 um resolution in any region of interest within a large specimen, such as a 300 mm wafer or CFRP panel will be showcased. This can be done in as little as a few minutes. We will also introduce a new XRM with 0.5 um spatial resolution for both hard and soft materials designed for central research labs. The power of a tunable quasi-monochromatic x-ray beam to enhance contrast of soft materials, from polymers, biological tissue, battery materials to nanoparticles will be illustrated.
S.H. Lau | Vice President, Business Development, Sigray Inc
S.H. has over 20 years’ experience in microscopy, material characterization and instrumentation in diverse applications from semiconductor failure analysis, material science to geomaterial research. He published several papers in FA, material characterization and imaging in the field of X-ray Microscopy. He is the Vice President of Sigray Inc., which is pioneering the development of ultra brightness, tunable x-ray sources and advanced x-ray optics for laboratory instrumentation and synchrotron applications